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Manual, Semiautomatic & Production
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DC, RF, Photonics, MEMS, High Power
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Positioners & Probe Accessories
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RF probes, Cal Substrates, Cal Software
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0.1GHz - 110GHz coaxial, small form factor, direct mount Delta Tuners
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50GHz - 330GHz Waveguide Tuners
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Active/Hybrid load pull
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Noise Figure
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High Speed Load Pull
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Ultra Low Noise & Low Leakage
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Extreme Temps: -65C to 600C, 4, 77 Kelvin
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WLR, Parametric, HV, MEMS, Cryo
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Robust, Long Life, and Low Cost of Ownership
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Innovative Test Sockets for all IC packages, WLCSP, SoC, FPGA, and Modules.
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For FA, Reliability, Burn-in/HAST, production and all other hand test applications.
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Benchtop test presses & PCB test fixtures for single/multi-unit testing of complex assemblies.
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MultiTrace Automated Curve Tracing Test Equipment with DataTrace software tools for DC parametric test, FA, & counterfeit detection.
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-100°C to +300°C capability, no LN2 or LCO2 required
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Fast thermal cycling and high accuracy
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Saves up to 50% energy
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Digitizers: 5 MS/s - 10 GS/s sampling rate with up to 4.7 GHz bandwidth
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AWGs: 40 MS/s - 1.25 GS/s output rate and > 500 MHz bandwidth
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Easy to use Software
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Over 200 product variations
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Gel-Box® : For secure shipping and handling of small valuable devices available in trays and slides
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Gel-Pak™(Vacuum Release Tray ) : For secure shipping and handling of larger devices, automated die handling, pocketless waffle pack, no edge/ topside contact
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Gel-Film/ Vertec® : Films for many customizable applications
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Single or Dual Mode VisibleIR for Top Side Thermal Imaging & FA
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Single or Dual Mode VisibleIR with NUV for Top Side Imaging
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Single or Dual Mode VisibleIR with NIR for Back Side Thermal imaging
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Ultra Fast Transient for Thermal Research Analysis
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EZ-Therm Series: Benchtop Economical System for Customers Existing Probe Stations for IR and TR
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Micro & Mini LED, VCSEL, Laser, Photodiode
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Optical Inspection
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Die Sortng
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High speed and high flexibility die sorting
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From Wafer Frame, Waffle or Gel Pack
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To Wafer Frame, Waffle or Gel Pack, Bulk, T&R
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Power Module Assembly & Test Solutions
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Optics Assembly & Test Solutions
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Laser Marking Handlers
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AOI
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Delta DC & AC Power Supplies
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High Power Bi-Directional Racks
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Power Supply Test Systems
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Battery Test Systems
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Electronic Loads
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1.2kV/1000A dynamic switch tests
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Double-pulse inductive load and
Diode Recovery testing up to
1000A -
Short circuit testing up to 1700A